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alloy-development-materialflow-mapping
There is no description for this dataset
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KupferDigital_BAM_Brinell_SecondaryDataset
KupferDigital mechanical testing dataset from BAM for the Brinell hardness test data of different copper alloys -
KupferDigital_BAM_LCF_H_27
KupferDigital mechanical testing dataset from BAM for the LCF test data of sample H27 -
SEM_CuSn8Ni2_IMWS
SEM data of CuSn8Ni2 -
KupferDigital_BAM_LCF_G_24
KupferDigital mechanical testing dataset from BAM for the LCF test data of sample G24 -
KupferDigital_BAM_Vickers_I9
KupferDigital mechanical testing dataset from BAM for the Vickers hardness test data of sample I9 -
KupferDigital_BAM_StressRelaxation_H_09
KupferDigital mechanical testing dataset from BAM for the tensile stress relaxation test data of sample H09 -
InfAI_raw_data
Raw data files for develop config of onto-process -
KupferDigital_BAM_Vickers_H10
KupferDigital mechanical testing dataset from BAM for the Vickers hardness test data of sample H10 -
KupferDigital_BAM_StressRelaxation_H_15
KupferDigital mechanical testing dataset from BAM for the tensile stress relaxation test data of sample H15 -
KupferDigital_BAM_Vickers_G22
KupferDigital mechanical testing dataset from BAM for the Vickers hardness test data of sample G22 -
KupferDigital_BAM_LCF_H_24
KupferDigital mechanical testing dataset from BAM for the LCF test data of sample H24 -
KupferDigital_BAM_StressRelaxation_G_09
KupferDigital mechanical testing dataset from BAM for the tensile stress relaxation test data of sample G09 -
calphad-7f21112-id3380
There is no description for this dataset
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SEM_CuZn23Si2.5_IMWS
SEM images of CuZn23Si2.5 -
KupferDigital_BAM_StressRelaxation_G_07
KupferDigital mechanical testing dataset from BAM for the tensile stress relaxation test data of sample G07 -
EDX_7kV_CuSn8Ni12_IMWS
results of EDX @7kV for CuSn8Ni12 -
KupferDigital_BAM_Tensile_G_18
KupferDigital mechanical testing dataset from BAM for the tensile test data of sample G18 -
KupferDigital_BAM_LCF_H_23
KupferDigital mechanical testing dataset from BAM for the LCF test data of sample H23 -
EDX_20kV_CuSn82-12_IMWS
results of EDX @ 20kV